A new physics-based self-heating effect model for 4H-SiC MESFETs

• 来源期刊: 中国物理B(英文版)
• 关键词: 4H silicon carbide metal semiconductor field effect transistor self-heating effect computer aided design
• 年，卷（期）: 2008,（12）
• 页码范围: 4622-4626
• 页数: 5页
• 语种: 英文

摘要

A new self-heating effect model for 4H-SiC MESFETs is proposed based on a combination of an analytical and a computer aided design (CAD) oriented drain current model. The circuit oriented expressions of 4H-SiC low-field electron mobility and incomplete ionization rate, which are related to temperature, are presented in this model, which are used to estimate the self-heating effect of 4H-SiC MESFETs. The verification of the present model is made, and the good agreement between simulated results and measured data of DC I - V curves with the self-heating effect is obtained.