Novel method for determining stacking disorder degree in hexagonal graphite by X-ray diffraction

• 来源期刊: 中国科学B辑（英文版）
• 年，卷（期）: 2009,（2）
• 页码范围: 174-180
• 页数: 7页
• 语种: 英文
• DOI: 10.1007/s11426-009-0009-z

摘要

The broadening effect of stacking disorder in hexagonal graphite is found experimentally by XRD to be identical to that of stacking faults in hexagonal-closed-packing (HCP) structure, which has obvious selective broadening effect. The Langford's method for dealing with the twofold broadening effects of the crystallite-faults in hexagonal ZnO has been extended in this paper, and then applied to the deter-mination of stacking disorder in 2H-graphite, which indicates that our extension method is convenient to both the experiments and data process, and may be generalized further. Two stacking disorder model in 2H-graphite and data processing method have been proposed in this study. The two disorder degrees of PAB and PABC can be computed when the two reliable FWHMs of 101 and 102 diffraction peaks were obtained.