Experimental study on microdeposition of the copper thin film by femtosecond laser-induced forward transfer

• 来源期刊: 中国物理B（英文版）
• 关键词: femtosecond laser laser-induced forward transfer thin film ablation deposition
• 年，卷（期）: 2009,（10）
• 页码范围: 4292-4297
• 页数: 6页
• 语种: 英文

摘要

The morphologies of the deposited dots on the 40 rim-thick copper film by the femtosecond laser-induced forwardtransfer that depend on the irradiated laser fluence have been studied, and the variations of orderliness of the diameterof deposited dots on the quartz substrate and forward ablated dot on the donor substrate with increasing pulse fluencehave been obtained experimentally. The experimental results show that a thinner copper film would generate larger-sizedablated dot and deposited dot at the threshold fluence for transfer. By x-ray diffraction measurement, it is demonstratedthat the crystal form of the transferred copper films is unaltered and the size of the crystallites is diminished.