Properties of passive film formed on 316L/2205 stainless steel by Mott-Schottky theory and constant current polarization method

• 来源期刊: 科学通报（英文版）
• 年，卷（期）: 2009,（13）
• 页码范围: 2239-2246
• 页数: 8页
• 语种: 英文
• DOI: 10.1007/s11434-009-0158-7

摘要

Semiconductor properties of the passive films formed on 316L and 2205 stainless steel were studied by Electrochemical Impedance Spectroscopy (EIS) in the high-temperature acetic acid.The results showed that the corrosion resistance of 2205 was higher than that of 316L,and the passive films formed on 316L and 2205 stainless steel showed p-type and n-type semiconductor behavior,respectively.Destruction and self-repairing of passive films were studied by using the constant current polarization method.The results showed that for 316L,the self-repairing process would occur when the destruction was lower than the critical extent or it would not do;for 2205,the self-repairing process only happened in a short time when the destruction was in the same extent as 316L.