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摘要:
A novel scalable model of substrate components for deep n-well (DNW) RF MOSFETs with different number of fingers is presented for the first time. The test structure developed in [1] is employed to directly access the characteristics of the substrate to extract the different substrate components. A methodology is developed to directly extract the parameters for the substrate network from the measured data. By using the measured two-port data of a set of nMOSFETs with different number of fingers, with the DNW in grounded and float configuration, respectively, the parameters of the scalable substrate model are obtained. The method and the substrate model are further verified and validated by matching the measured and simulated output admittances. Excellent agreement up to 40 GHz for configurations in common-source has been achieved.
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篇名 A Scalable Model of the Substrate Network in Deep n-Well RF MOSFETs with Multiple Fingers
来源期刊 电路与系统(英文) 学科 医学
关键词 DEEP N-Well (DNW) RF MOSFETS Substrate Network SCALABLE Model
年,卷(期) 2011,(2) 所属期刊栏目
研究方向 页码范围 91-100
页数 10页 分类号 R73
字数 语种
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研究主题发展历程
节点文献
DEEP
N-Well
(DNW)
RF
MOSFETS
Substrate
Network
SCALABLE
Model
研究起点
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研究分支
研究去脉
引文网络交叉学科
相关学者/机构
期刊影响力
电路与系统(英文)
月刊
2153-1285
武汉市江夏区汤逊湖北路38号光谷总部空间
出版文献量(篇)
286
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0
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0
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