| 篇名 | Study on the defect-related emissions in the light self-ion-implanted Si films by a silicon-on-insulator structure | ||
| 来源期刊 | 中国物理B(英文版) | 学科 | |
| 关键词 | self-ion-implantation photoluminescence interstitial cluster silicon-on-insulator | ||
| 年,卷(期) | 2011,(2) | 所属期刊栏目 | |
| 研究方向 | 页码范围 | 395-401 | |
| 页数 | 7页 | 分类号 | |
| 字数 | 语种 | 英文 | |
| DOI | 10.1088/1674-1056/20/2/026802 | ||