篇名 | Measurement accuracy analysis of the free carrier absorption determination of the electronic transport properties of silicon wafers | ||
来源期刊 | 中国物理B(英文版) | 学科 | |
关键词 | laterally resolved modulated free-carrier absorption frequency scans electronic transport properties accuracy | ||
年,卷(期) | 2011,(6) | 所属期刊栏目 | |
研究方向 | 页码范围 | 498-504 | |
页数 | 7页 | 分类号 | |
字数 | 语种 | 英文 | |
DOI | 10.1088/1674-1056/20/6/068105 |