Polarization Fizeau interferometer based on birefringent thin film

• 来源期刊: 中国光学快报（英文版）
• 年，卷（期）: 2012,（6）
• 页码范围: 34-36
• 页数: 3页
• 语种: 英文
• DOI: 10.3788/COL201210.061201

摘要

A polarization Fizeau interferometer based on birefringent thin film is presented.The interferometer adopts a birefringent thin film to obtain orthogonally polarized and strictly common-path reference and test beams.Advantages include ease of implementation on large-aperture interferometer,measuring test optics from long distance,and achieving high fringe visibility.The phase shift is obtained by combining a quarterwave plate and an analyzer.The concepts illustrated are verified experimentally.