Direct Piezoelectric Potential Measurement of ZnO Nanowires Using a Kelvin Probe Force Microscope

• 来源期刊: 中国物理快报（英文版）
• 年，卷（期）: 2013,（4）
• 页码范围: 201-204
• 页数: 4页
• 语种: 英文
• DOI: 10.1088/0256-307X/30/4/047702

摘要

Nanoscale power generators have drawn tremendous interest in recent years for their potential use in all kinds of nano electronic devices.Among them,nanogenerators (NGs)[1,2] using piezoelectric ZnO NWs as building blocks have attracted special attention because they can convert environmental energy (e.g.,heart beat,body movement) to electricity.Since the first report on NGs in 2006,exciting achievements have been made by different groups.[3-6]Despite of these experimental achievements,theoretical understanding of the working principles and governing factors has become important for the future development of NGs.This requires precise measurements of electrical signals generated by NG devices.Usually,the piezoelectric voltage signals of NG devices are tested using a semiconductor characterization system (SCS) by setting the input electric signals as "0".[1,2] However,in this case,many factors such as huge contact resistances between metal films and ZnO NW tips,internal resistances,and surface potential distributions will inevitably influence the measured piezoelectric signals.Moreover,the resistance and capacitance of the testing circuit will fluctuate when the devices are subject to mechanical stimulations,which will add undesirable noises to the measured signals.Obviously,novel methods must be developed to precisely quantify the piezoelectric signals of ZnO NW based NG devices.