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摘要:
Two optical methods, namely crystal facet reflection and etching pits reflection, were used to orient and high-purity germanium crystals. The X-ray diffraction patterns of three slices that were cut from the oriented and crystals were measured by X-ray diffraction. The experimental errors of crystal facet reflection method and etching pits reflection method are in the range of 0.05° - 0.12°. The crystal facet reflection method and etching pits reflection method are extremely simple and cheap and their accuracies are acceptable for characterizing high purity detector-grade germanium crystals.
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篇名 Optical Methods in Orientation of High-Purity Germanium Crystal
来源期刊 结晶过程及技术期刊(英文) 学科 化学
关键词 REFLECTION METHOD HIGH-PURITY GERMANIUM CRYSTAL
年,卷(期) 2013,(2) 所属期刊栏目
研究方向 页码范围 60-63
页数 4页 分类号 O6
字数 语种
DOI
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REFLECTION
METHOD
HIGH-PURITY
GERMANIUM
CRYSTAL
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期刊影响力
结晶过程及技术期刊(英文)
季刊
2161-7678
武汉市江夏区汤逊湖北路38号光谷总部空间
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109
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