Dual-Frequency Atomic Force Microscopy Imaging Method and Experiment Based on Commercial AFM Platform

• 来源期刊: 中国物理快报（英文版）
• 年，卷（期）: 2013,（6）
• 页码范围: 56-57
• 页数: 2页
• 语种: 英文
• DOI: 10.1088/0256-307X/30/6/060702

摘要

A dual-frequency atomic force microscopy imaging system is set up to enhance the amplitude of higher harmonic signals.The experimental results of the dual-frequency imaging technology are given.Normally the image of the higher harmonic is helpful to optimize the imaging conditions in tapping mode and allows one to differentiate qualitatively between dissimilar materials that are hardly distinguishable by traditional atomic force microscopy.