The Effect of By-pass Current on the Accuracy of Resistivity Measurement in a Diamond Anvil Cell

• 来源期刊: 中国物理快报（英文版）
• 年，卷（期）: 2013,（6）
• 页码范围: 53-55
• 页数: 3页
• 语种: 英文
• DOI: 10.1088/0256-307X/30/6/060701

摘要

We report a quantitative analysis of by-pass current effect on the accuracy of resistivity measurement in a diamond anvil cell.Due to the by-pass current,the sample resistivity calculated by the van der Pauw method is obviously smaller than the actual value and the problem becomes more serious for a high-resistivity sample.For the consideration of high accuracy of resistivity measurement,a method is presented that the inside wall of the sample chamber should be covered by a polymethylmethane layer.With this highly insulating layer,the by-pass current is effectively prevented and the current density distribution inside the sample is very close to the ideal case.