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摘要:
La0.7Sr0.3CoO3 (LSCO) thin films were epitaxially grown on (001)-single crystalline LaAlO3 substrates by metal organic deposition. The evolution of the crystallinity of the films having various thicknesses and obtained at various annealing temperatures is investigated using Raman spectroscopy. The Raman mode associated to the Jahn-Teller distortions in the LSCO films is found to be dependent on the annealing temperature and sensitive to the strain state evolution with film thickness. The microstructure and morphology of the obtained films were investigated using transmission electron microscopy observations on cross-sections and atomic force microscopy. The obtained films are characterized by nanocrystalline morphology, with an average roughness around 5 nm. By increasing the annealing temperature to 1000℃ and the film thickness to 100 nm, the electrical resistivity was decreased by several orders of magnitude. The film resistivity reaches approximately 2.7 × 10–4 Ω•cm in a wide interval of temperature of 77 - 320 K, making this material a promising candidate for a variety of applications.
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篇名 Metal-Organic Deposition of Epitaxial La<sub>0.7</sub>Sr<sub>0.3</sub>CoO<sub>3</sub>Thin Films on LaAlO<sub>3</sub>Substrates
来源期刊 晶体结构理论与应用(英文) 学科 物理学
关键词 La0.7Sr0.3CoO3 Thin Films MOD TEM Raman Spectroscopy RESISTIVITY
年,卷(期) 2015,(1) 所属期刊栏目
研究方向 页码范围 1-8
页数 8页 分类号 O4
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La0.7Sr0.3CoO3
Thin
Films
MOD
TEM
Raman
Spectroscopy
RESISTIVITY
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晶体结构理论与应用(英文)
季刊
2169-2491
武汉市江夏区汤逊湖北路38号光谷总部空间
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80
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0
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