Quantum integrated circuit: classical characterization

• 来源期刊: 科学通报（英文版）
• 年，卷（期）: 2015,（1）
• 页码范围: 141
• 页数: 1页
• 语种: 中文
• DOI: 10.1007/s11434-014-0703-x

摘要

Quantum technologies promise a safer and faster life for us.One of the difficulties in developing quantum technologies is the scalability of quantum devices.Integrated quantum circuits based on waveguide networks fabricated by direct laser writing have become an attractive subject [1].However,for the N-input and N-output (N × N) integrated quantum circuit,the characterization of the operators becomes a hard problem when N is large.The measurement settings for the traditional quantum process tomography would exponentially increase with N.