Effect of Heat Treatment on the Nanoscale Structure and Optical Properties of Cd<sub>2</sub>SnO<sub>4</sub>Thin Films Deposited by RF Magnetron Sputtering

• 作者: Ateyyah M. Al-Baradi
• 来源期刊: 现代物理(英文)
• 学科: 物理学
• 关键词: Thin Films Atomic Force MICROSCOPE TRANSMITTANCE Reflectance OPTICAL Energy Gap OPTICAL Conductivity
• 年，卷（期）: 2015,（13）
• 页码范围: 1803-1813
• 页数: 11页
• 分类号: O48

摘要

Cadmium tin oxide Cd2SnO4 thin films with a thickness of 228.5 nm were prepared by RF magnetron sputtering technique on glass substrates at room temperature. AFM has been utilized to study the morphology of these films as a function of annealing temperature at the nanoscale. The optical properties of these films, such as the transmittance, T(λ), and reflectance, R(λ), have been studied as a function of annealing temperature. The optical constants, such as optical energy gap, width of the band tails of the localized states, refractive index, oscillatory energy, dispersion energy, real and imaginary parts of both dielectric constant and optical conductivity have been found to be affected by changing the annealing temperature of the films.