A highly pixelated CdZnTe detector based on Topmetal-Ⅱ-sensor

• 来源期刊: 中国物理C（英文版）
• 年，卷（期）: 2017,（4）
• 页码范围: 155-158
• 页数: 4页
• 语种: 英文
• DOI: 10.1088/1674-1137/41/4/046003

摘要

Topmetal-Ⅱ-is a low noise CMOS pixel direct charge sensor with a pitch of 83 μm.CdZnTe is an excellent semiconductor material for radiation detection.The combination of CdZnTe and the sensor makes it possible to build a detector with high spatial resolution.In our experiments,an epoxy adhesive is used as the conductive medium to connect the sensor and cadmium zinc telluride (CdZnTe).The diffusion coefficient and charge efficiency of electrons are measured at a low bias voltage of-2 V,and the image of a single alpha particle is clear with a reasonable spatial resolution.A detector with such a structure has the potential to be applied in X-ray imaging systems with further improvements of the sensor.