Ion Photon Emission Microscope for Single Event Effect Testing in CIAE

• 来源期刊: 中国物理快报（英文版）
• 关键词: @@
• 年，卷（期）: 2017,（7）
• 页码范围: 71-75
• 页数: 5页
• 语种: 英文
• DOI: 10.1088/0256-307X/34/7/073401

摘要

Ion photon emission microscopy (IPEM) is a new ion-induced emission microscopy.It employs a broad ion beam with high energy and low fluence rate impinging on a sample.The position of a single ion is detected by an optical system with objective lens,prism,microscope tube and charge coupled device (CCD).A thin ZnS film doped with Ag ions is used as a luminescent material.Generation efficiency and transmission effciency of photons in the ZnS(Ag) film created by irradiated CI ions are calculated.A single CI ion optical microscopic image is observed by high quantum effciency CCD.The resolution of a single CI ion given in this IPEM system is 6μm.Several factors influencing the resolution are discussed.A silicon diode is used to collect the electrical signals caused by the incident ions.Effective and accidental coincidence of optical images and electronic signals are illustrated.A two-dimensional map of single event effect is drawn out according to the data of effective coincidence.