Correlative Measurement of MeV Highly Charged Ions With Surfaces

• 作者: Chen Yanhong Cheng Rui Lei Yu Wang Yuyu Xiao Guoqing Zhou Xianming
• 来源期刊: 中国科学院近代物理研究所和兰州重离子研究装置年报:英文版
• 学科: 物理学
• 关键词: surface. HIGHLY EXCITATION
• 年，卷（期）: 2018,（1）
• 页码范围: 77-77
• 页数: 1页
• 分类号: O57

摘要

Medium MeV energy highly charged ions(MeV HCI)are unique tool to study the process of ion-matter interaction,they not only carry high potential energy,but also have high incident energy.They have both advantages on potential energy carried in slow highly charged ions and electronic energy loss in swift heavy ions[1;2].When MeV HCI impact on the surface by normal incidence or glancing incidence,the whole energy(potential energy+kinetic energy)will release in very short time,produce extremely high power deposition density,then induce a serial of strong excitation process-the enhance of secondary particles,X-ray emission and nano-track production on the surface.