Graphene and 2D TMD material optical characterization with scanning probe microscopy

• 来源期刊: 中国科学基金（英文版）
• 年，卷（期）: 2018,（4）
• 页码范围: 50-59
• 页数: 10页
• 语种: 英文
• DOI: 10.16262/j.cnki.1005-0841.2018.04.001

摘要

Two-dimensional (2D) materials distinguish themselves by high specific surface areas and wide tunability in nanophotonics research.As the developing of 2D materials optical and opto-electronic investigations,scanning probe microscopy provides high spatial resolution and strong local field confinement,which can realize the single molecular and atomic level of characterization.Here,we review the nanophotonic and opto-electronic features of both pristine and hybrid 2D materials which are measured by scanning probe microscopy.The conclusion and prospective of scanning probe techniques for the future 2D materials characterization and practical applications are presented.