Analysis and testing of total ionizing dose effect on several commercial optical transceivers via gamma-ray radiation

• 来源期刊: 中国光学快报（英文版）
• 年，卷（期）: 2019,（5）
• 页码范围: 78-83
• 页数: 6页
• 语种: 英文
• DOI: 10.3788/COL201917.052302

摘要

In our Letter,we selected several commercial optical transceivers,which consist of single-channel transceiver modules,parallel transmitting and receiving modules,and Ethernet passive optical network (EPON) optical line terminal (OLT) and optical network unit (ONU) modules,to do the total ionizing dose (TID) testing via the gamma-ray radiation method.The changing of current and receiver sensitivity of optical transceivers is discussed and analyzed.Based on the TID testing exposed to a TID of 50 krad (Si) at a dose rate of about 0.1 rad (Si)/s,the performance of single-channel transceivers and parallel receiving modules has not changed after 50 krad (Si)exposure,the parallel transmitting and EPON ONU modules have not worked after 40 krad (Si) and 47 krad (Si)exposure,the EPON OLT module has bit error in the process of irradiation,and it can work well after annealing;the reason for the error of OLT is analyzed.Finally,based on the theoretical analysis and testing results,this Letter provides several design suggestions to improve the reliability for optical transceivers,which can be referenced by satellite system designation for various space missions.