Atomic-scale imaging of the defect dynamics in ceria nanowires under heating by in situ aberration-corrected TEM

• 来源期刊: 中国科学:化学（英文版）
• 年，卷（期）: 2019,（12）
• 页码范围: 1704-1709
• 页数: 6页
• 语种: 英文

摘要

The defects in the ceria usually work as the active reaction sites in their industrial applications.In this article,we studied the formation and atomic process of the defects of ceria nanowires under heating by using in situ aberration-corrected transmission electron microscopy (Cs-TEM) method.With the temperature elevating,ceria nanowires are reduced and defects begin to appear and grow up.When temperature reaches 1,023 K,the defect morphology exhibits the rhombus or hexagon patterns,which are surrounded by { 111 } and {200} planes with lower surface energy,and the heated ceria still maintain the same cubic fluorite structure as their parent.It is also indicated that the formation of defects originates from the release of lattice oxygen and the volatilization of surface Ce ions.This work provides an important insight into designing ceria-based catalysts and ionic conductors.