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摘要:
Texturing of diamond wire cut wafers using a standard wafer etch process chemistry has always been a challenge in solar cell manufacturing industry. This is due to the change in surface morphology of diamond wire cut wafers and the abundant presence of amorphous silicon content, which are introduced from wafer manufacturing industry during sawing of multi-crystalline wafers using ultra-thin diamond wires. The industry standard texturing process for multi-crystalline wafers cannot deliver a homogeneous etched silicon surface, thereby requiring an additive compound, which acts like a surfactant in the acidic etch bath to enhance the texturing quality on diamond wire cut wafers. Black silicon wafers on the other hand require completely a different process chemistry and are normally textured using a metal catalyst assisted etching technique or by plasma reactive ion etching technique. In this paper, various challenges associated with cell processing steps using diamond wire cut and black silicon wafers along with cell electrical results using each of these wafer types are discussed.
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篇名 Challenges in Processing Diamond Wire Cut and Black Silicon Wafers in Large-Scale Manufacturing of High Efficiency Solar Cells
来源期刊 电力能源(英文) 学科 工学
关键词 DIAMOND WIRE CUT BLACK SILICON Slurry Wafers Amorphous SILICON Additives Etching and TEXTURIZATION
年,卷(期) 2020,(2) 所属期刊栏目
研究方向 页码范围 65-77
页数 13页 分类号 TN3
字数 语种
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研究主题发展历程
节点文献
DIAMOND
WIRE
CUT
BLACK
SILICON
Slurry
Wafers
Amorphous
SILICON
Additives
Etching
and
TEXTURIZATION
研究起点
研究来源
研究分支
研究去脉
引文网络交叉学科
相关学者/机构
期刊影响力
电力能源(英文)
月刊
2327-588X
武汉市江夏区汤逊湖北路38号光谷总部空间
出版文献量(篇)
568
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0
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0
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