A large-grain-size thick-film polycrystalline diamond detector for x-ray detection

• 作者: Changjun QIU Haiyang ZHOU Ping XU Yi YU
• 来源期刊: 等离子体科学和技术（英文版）
• 年，卷（期）: 2020,（12）
• 所属期刊栏目: FUSION ENGINEERING
• 页码范围: 97-103
• 页数: 7页
• 语种: 英文

摘要

A diamond film with a size of 6 × 6 × 0.5 mm3 is fabricated by electron-assisted chemical vapor deposition.Raman spectrum analysis,x-ray diffraction and scanning electron microscope images confirm the high purity and large grain size,which is larger than 300 μm.Its resistivity is higher than 1012 Ω · cm.Interlaced-finger electrodes are imprinted onto the diamond film to develop an x-ray detector.Ohmic contact is confirmed by checking the linearity of its current-voltage curve.The dark current is lower than 0.1 nA under an electric field of 30 kV cm-1.The time response is 220 ps.The sensitivity is about 125 mAW-1 under a biasing voltage of 100 V.A good linear radiation dose rate is also confirmed.This diamond detector is used to measure x-ray on a Z-pinch,which has a double-layer'nested tungsten wire array'.The pronounced peaks in the measured waveform clearly characterize the x-ray bursts,which proves the performance of this diamond detector.