Determination of interface layer thickness of a pseudo two—phase system by extension of the Debye equation

• 作者: BaoZh DongWu JunWang MinPu YanJunGong YiLiu YuHanSun ZhiHongLi
• 来源期刊: 北京同步辐射装置：英文版
• 学科: 化学
• 关键词: 扩展德拜方程式 假两相体系 界面层厚度 SAXS 小角X射线散射分析 中孔硅石 中孔渗水
• 年，卷（期）: 2001,（2）
• 页码范围: 16-19
• 页数: 4页
• 分类号: O613.72

摘要

The Debye equation with slit-smeared small angle x-ray scattering(SAXS) data is extended form an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer,and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials.This method is tested by experimental SAXS data,which were measured at 25℃,of organo-modified mesoporous silica prepared by condensation of tetraethoxysiland(TEOS) and methyltriethoxysilane(MTES) using non-ionic neutral surfactant as template under neutral condition.