Micro—structural analysis of YBa2Cu3O7—x thin films grown on different substrates by X—ray techniques

• 作者: C.X.Liu J.G K.Tao L.S.Wu M.Xu N.Yang W.H.Tang X.M.Chen Z.H.Mai
• 来源期刊: 北京同步辐射装置：英文版
• 学科: 物理学
• 关键词: 微观结构 X射线衍射分析 YBa2Cu3O7薄膜 钇钡铜复合氧化物薄膜 缓冲层 薄膜生长
• 年，卷（期）: bjtbfszzywb,（2）
• 页码范围: 54-60
• 页数: 7页
• 分类号: O484.1

摘要

YBa2Cu3Ox(YBCO) thin films grown on different substrates with and/or without Eu2CuO4(ECO) buffer layer were investigated by X-ray wide angle diffraction,reflection,diffuse scattering and topography.Theresults show that for the yttria stabilized ZrO2(YSZ) substrate,the presence of an ECO buffer layer improves the crystalline quality of the YBCO film,while a negative effect is observed for the SrTiO3(STO) substrate.The lateral correlation length for a sample grown on a YSZ substrate with ECO buffer Layer is much greater than grown on an STO subetrate.The STO substrate used has mosaic structure.2001 Elsevier Science B.V.All rights reserved.