Near-Field Characterization of Optical Micro/Nanofibres

• 来源期刊: 中国物理快报（英文版）
• 年，卷（期）: 2007,（10）
• 页码范围: 3006-3008
• 页数: 3页
• 语种: 英文

摘要

Near-field scanning optical microscopy is used to investigate the waveguiding properties of optical micro/nanofibres (MNFs) by means of detecting optical power carried by evanescent waves. Taper drawn silica and tellurite MNFs,supported on low-index substrates, are used to guide a 532-nm-wavelength light beam for the test. Modification of the single-mode condition of the MNF in the presence of a substrate is observed. Spatial modulation of the longitudinal field intensity (with a 195-nm period) near the output end of a 760-nm-diameter silica MNF is well resolved. Energy exchange through evanescent coupling between two parallel MNFs is also investigated.