An accurate model for the thin film flow

• 来源期刊: 力学学报（英文版）
• 年，卷（期）: 2008,（4）
• 页码范围: 375-380
• 页数: 6页
• 语种: 英文
• DOI: 10.1007/s10409-008-0149-y

摘要

This paper deals with the linear stability of a liquid film flowing down an inclined plane. The Navier-Stokes equations were reduced into four evolution equations that describe the development of the film depth, the flow rate, the free surface velocity, and the wall shear stress, using the Karman-Polhausen boundary layer integral method. Thus, we were able to determine the stability threshold and approach well the critical wave number for long waves. The obtained results were found to be in good agreement with the experiments of Liu et al.