Self-Sensing and –Actuating Probes for Tapping Mode AFM Measurements of Soft Polymers at a Wide Range of Temperatures

• 作者: Anton Efimov Boris Matsko Ferdinand Hofer Ines Haynl Julian Wagner Nadejda B. Matsko Stefan Mitsche Werner Grogger Wolfgang Czapek
• 来源期刊: 现代物理(英文)
• 学科: 化学
• 关键词: Tuning FORK SHARP Tungsten Tip AFM TAPPING Mode SOFT Materials
• 年，卷（期）: 2011,（2）
• 页码范围: 72-78
• 页数: 7页
• 分类号: O6

摘要

Self-sensing and –actuating probes optimized for conventional tapping mode atomic force microscopy (AFM) are described. 32-kHz quartz tuning forks with a chemically etched and focus ion beam (FIB) sharpened (curvature radii are 5-10 nm) tungsten tip are stable at air and liquid nitrogen atmosphere and at a wide range of temperatures. If driven at constant frequency, the scan speed of such sensors can be up to 3 Hz. AFM was performed on polymer samples in order to study the stability and applicability of these sensor for investigation of soft materials with high dynamical tendencies.