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摘要:
Optoelectronic property of ZnO epitaxial layer grown by plasma-assisted epitaxy at temperature as low as 340°C using Ti2O3 buffer layer on a-sapphire were studied by low temperature photoluminescence at 10 K comparing to the layers on c-sapphire and a-sapphire without the buffer layer. The near band-edge emission consisting of free-exciton emissions and neutral-donor bound exciton emissions was significantly dependent on the buffer thickness and dominated by the free-exciton emissions in the layer grown on the very thin buffer layer about 0.8 nm, whereas the intense emissions by neutral-donor bound excitons were observed in the ZnO layer on c-sapphire. The structural behavior indicated the donor was originated from the three-dimensional growth of ZnO layer and details of the optoelectronic feature suggested the residual donors were Al and interstitial-Zn.
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篇名 ZnO Heteroepitaxy on Sapphire Using a Novel Buffer Layer of Titanium Oxide: Optoelectronic Behavior
来源期刊 晶体结构理论与应用(英文) 学科 医学
关键词 ZNO Ti2O3 Plasma-Assisted EPITAXY Photoluminescence Free-Exciton Bound-Exciton
年,卷(期) 2013,(3) 所属期刊栏目
研究方向 页码范围 100-105
页数 6页 分类号 R73
字数 语种
DOI
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研究主题发展历程
节点文献
ZNO
Ti2O3
Plasma-Assisted
EPITAXY
Photoluminescence
Free-Exciton
Bound-Exciton
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相关学者/机构
期刊影响力
晶体结构理论与应用(英文)
季刊
2169-2491
武汉市江夏区汤逊湖北路38号光谷总部空间
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80
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0
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0
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