Design for Distributed Integrated Electronic System BIT

• 作者: Liu Rui
• 来源期刊: 国际技术管理
• 学科: 社会科学
• 关键词: BIT FAULT TREE Integrated ELECTRONIC system
• 年，卷（期）: 2016,（6）
• 页码范围: 35-37
• 页数: 3页
• 分类号: G3

摘要

The design model of system-level and module-level BIT system are established based on hierarchical BIT design. The unifi ed data structure of PBIT, CBIT, IBIT test item including detection function and recovery function are designed. Fault tree theory is introduced to BIT system and the PBIT, CBIT, IBIT universal automatic traversal fault tree test algorithm is designed, which can realize the bottom-up node test of integrated electronic system and top-down fault diagnosis. In a integrated electronic system application show that the scheme of online health monitoring and fault diagnosis based on BIT is reasonable and feasible, easy to maintain, and can improve integrated electronic system testability and reliability.