Position Sensitive Detector Used to Detect Beam Profile

• 来源期刊: 中国科学院近代物理研究所和兰州重离子研究装置年报：英文版
• 学科: 工学
• 年，卷（期）: 2001,（1）
• 页码范围: 114-114
• 页数: 1页
• 分类号: TH87

摘要

Non-destructive diagnostic methods are very important for beam adjustments and monitors,especially when the beam intensity is less than 10~8 pps during the heavy-ion treatment of cancer.Now the diagnostic devices of HIFRL can’t satisfy the requests,so we decide to construct a detecting system of the residual-gas beam profile~([1,2]).The system uses the Position Sensitive Detector(PSD)~([3,4])based on microchannel plate(MCP)to