A comparative study on radiation reliability of composite channel InP high electron mobility transistors

• 作者: Jia-Jia Zhang Peng Ding Ya-Nan Jin Sheng-Hao Meng Xiang-Qian Zhao Yan-Fei Hu Ying-Hui Zhong Zhi Jin
• 来源期刊: 中国物理B（英文版）
• 年，卷（期）: 2021,（7）
• 所属期刊栏目: GENERAL
• 页码范围: 203-209
• 页数: 7页
• 语种: 英文
• DOI: 10.1088/1674-1056/abe2fd

摘要

This paper proposes a reasonable radiation-resistant composite channel structure for InP HEMTs.The simulation results show that the composite channel structure has excellent electrical properties due to increased modulation doping efficiency and carrier confinement.Moreover,the direct current (DC) and radio frequency (RF) characteristics and their reliability between the single channel structure and the composite channel structure after 75-keV proton irradiation are compared in detail.The results show that the composite channel structure has excellent radiation tolerance.Mechanism analysis demonstrates that the composite channel structure weakens the carrier removal effect.This phenomenon can account for the increase of native carrier and the decrease of defect capture rate.