ESD Protection Design and Characteristic Analysis of Advanced Process Integrated Circuit

• 作者: Mao Fan
• 来源期刊: 电气工程与自动化:中英文版
• 学科: 医学
• 关键词: Electrostatic Protection Integrated Circuit Failure Analysis
• 年，卷（期）: 2020,（1）
• 页码范围: 1-3
• 页数: 3页
• 分类号: R73

摘要

The electrostatic discharge(ESD)phenomenon is very common,in daily life,many places will appear ESD phenomenon.However,ESD is a potential hazard for integrated circuits.This paper analyzes the ESD protection design and characteristics of advanced process integrated circuits,and puts forward personal views combined with experience,hoping to bring help to the people who pay attention to the ESD protection of integrated circuits.