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摘要:
Photoluminescence (PL) was investigated as functions of the excitation intensity and temperature for a coupling sur-face quantum dots (SQDs) structure which consists of one In0.3Ga0.7As SQDs layer being stacked on multi-layers of In0.3Ga0.7As buried quantum dots (BQDs).Accompanied by considering the localized excitons effect induced by inter-face fluctuation,carrier transition between BQDs and SQDs were analyzed carefully.The PL measurements confirm that there is a strong carrier transition from BQDs to SQDs and this transition leads to obvious different PL character-istics between BQDs and SQDs.These results are useful for future application of SQDs as surface sensitive sensors.
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篇名 Photoluminescence study of the In0.3Ga0.7As surface quantum dots coupling structure
来源期刊 光电子快报(英文版) 学科
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年,卷(期) 2021,(5) 所属期刊栏目 Materials
研究方向 页码范围 302-307
页数 6页 分类号
字数 语种 英文
DOI 10.1007/s11801-021-0108-4
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光电子快报(英文版)
双月刊
1673-1905
12-1370/TN
16开
天津市南开区红旗南路263号
2005
eng
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1956
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