SY509-3-196 [篇名] A novel strainedsurface-channel pMOSFET Si{sub}0.7Ge{sub}0.3 with an ALDTiN/AI{sub}20{ sub}3/HfAIO{ sub }x/AI{ sub}20{ sub }3 gatestack;SY509-3-197 [篇名] A quantitative study of the nano-scratch behavior of boron and carbon nitride films;……