In-situ/operando characterization techniques for organic semiconductors and devices

• 作者: Sai Jiang Qinyong Dai Jianhang Guo Yun Li
• 来源期刊: 半导体学报（英文版）
• 年，卷（期）: 2022,（4）
• 所属期刊栏目: REVIEWS
• 页码范围: 15-25
• 页数: 11页
• 语种: 英文
• DOI: 10.1088/1674-4926/43/4/041101

摘要

The increasing demands of multifunctional organic electronics require advanced organic semiconducting materials to be developed and significant improvements to be made to device performance.Thus,it is necessary to gain an in-depth un-derstanding of the film growth process,electronic states,and dynamic structure-property relationship under realistic opera-tion conditions,which can be obtained by in-situ/operando characterization techniques for organic devices.Here,the up-to-date developments in the in-situ/operando optical,scanning probe microscopy,and spectroscopy techniques that are em-ployed for studies of film morphological evolution,crystal structures,semiconductor-electrolyte interface properties,and charge carrier dynamics are described and summarized.These advanced technologies leverage the traditional static characteriza-tions into an in-situ and interactive manipulation of organic semiconducting films and devices without sacrificing the resolu-tion,which facilitates the exploration of the intrinsic structure-property relationship of organic materials and the optimization of organic devices for advanced applications.