| 篇名 | Comparison of electron transmittances and tunneling currents in an anisotropic TiNx/HfO2/SiO2/p-Si(100)metal-oxide-semiconductor(MOS)capacitor calculated using exponential-and Airy-wavefunction approaches and a transfer matrix method | ||
| 来源期刊 | 半导体学报 | 学科 | 工学 |
| 关键词 | |||
| 年,卷(期) | 2010,(12) | 所属期刊栏目 | |
| 研究方向 | 页码范围 | 28-32 | |
| 页数 | 分类号 | TN3 | |
| 字数 | 语种 | 中文 | |
| DOI | 10.1088/1674-4926/31/12/124002 | ||